Dated change feeds / US Tech Automations

Feeds/Domain tools/TestLotReplay

Semiconductor test data

TestLotReplay

Reconstruct which physical devices were tested or retested and compare first-attempt and final-observed outcomes without double-counting repeated parts or mixing test definitions across lots.

Browser tool
Free
Input
Files stay on this device
Result
Downloadable ZIP

Runs on this device. Nothing is uploaded.

Use your files

Input format and limits / Download example files

Browser limits: 16 MiB per file, 32 MiB total, and 45 seconds per run. Files are processed on this device.

Or paste JSON input

Selected files take priority over JSON. With empty inputs, either run button uses the included example.

Result and method

first/final outcome views, transition matrix, bin Pareto

How the calculation works

streaming record decoding, per-head/site device episodes, explicit physical identity and chronology, and keyed wafer aggregation.

Limits

  • No tester connection, installation service or analyst intervention.
  • bounded record coverage, explicit chronology and no custom vendor support

Exact input files, output columns and local workflows

Reproducibility

Example source: synthetic input supplied with this engine. Example computation checked: 2026-09-10T04:20:45.765318+00:00.

Engine source / Example check record

Offline batch edition

View exact files, fixed version and availability

Checkout unavailable on this free tool page. Availability is checked on the offline edition page.

Contact US Tech Automations / operations@ustechautomations.com