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Semiconductor test data

TestLotReplay offline edition

Fixed-version ZIP: 12 included files.

Reconstruct which physical devices were tested or retested and compare first-attempt and final-observed outcomes without double-counting repeated parts or mixing test definitions across lots.

Availability
Checkout unavailable
Edition
Fixed version
Delivery
Private ZIP download after payment confirmation

Try the free browser tool

Included in this edition

first/final outcome views, transition matrix, bin Pareto

The free tool and this kit use the same engine. The kit adds the fixed-version batch runner, reusable CSV column profiles, replay receipts, tests and documentation. It does not add unsupported formats, custom integration work or a larger engine limit.

Version
1.0-dccd45e01e76
Archive
testlotreplay-1.0-dccd45e01e76.zip (29,641 bytes)
Archive SHA-256
80c2fa1791c5ae67e525c3097a210ab39ca62b36cd9ff3de24a380718c8d225a
Exact included files (12)
  • BATCH-USAGE.md
  • KIT-MANIFEST.json
  • README.md
  • batch.py
  • input.schema.json
  • product.py
  • samples/file-input/input.stdf
  • samples/file-input/settings.json
  • samples/invalid.json
  • samples/unknown.json
  • samples/valid.json
  • test_product.py

Source: this archive's KIT-MANIFEST.json. Package hashes checked: 2026-09-10T04:20:45.811685+00:00. This checks package contents, not purchase availability.

Exact input and output formats / Engine documentation

Execution limits

Python 3.12 or newer. TileMosaic also requires the versions in requirements.txt. Batch runner: at most 200 jobs per invocation, 32 MiB of original input per job and 45 seconds per engine process. Write each replay to a new output folder. Engine-specific limits still apply. Future updates and installation services are not included.

  • No tester connection, installation service or analyst intervention.
  • bounded record coverage, explicit chronology and no custom vendor support
  • Bounded STDF V4 subset, IEEE little/big endian. Up to 32 sources and 8 MB combined binary input per engine job.
  • Explicit part-ID or wafer-coordinate identity and file chronology; unsupported records or incomplete episodes withhold dependent totals.
  • No universal tester compatibility, STDF editing, equipment map, Cpk, process recommendation or manufacturing acceptance.
  • The result attempts.csv contains provenance columns and is not automatically accepted as normalized input. Select the documented input columns explicitly.

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